BAHTIAR, Satya Abdul Halim; DEWA, Chandra Kusuma; LUTHFI, Ahmad. Comparison of Naïve Bayes and Logistic Regression in Sentiment Analysis on Marketplace Reviews Using Rating-Based Labeling. Journal of Information Systems and Informatics, [S. l.], v. 5, n. 3, p. 915–927, 2023. DOI: 10.51519/journalisi.v5i3.539. Disponível em: https://www.journal-isi.org/index.php/isi/article/view/539. Acesso em: 7 mar. 2026.